Evaluation of an ADC BIST Technique Using Statistical Simulation
Date Issued
2004
Date
2004
Author(s)
Chen, Yi-Ren
DOI
en-US
Abstract
Unlike their digital counterparts, analog/mixed-signal DfT (Design-for-Test) techniques are still far from being widely adopted. One of the reasons that lead to the low acceptance is the lack of efficient methodologies to evaluate the effectiveness of the AMS (analog/mixed-signal) DfT techniques. In this thesis, we developed a statistical process simulation tool to estimate the performance distribution of an AMS circuit. Unlike traditional Monte-Carlo simulation techniques which disregard the correlation between process and circuit parameters, the proposed statistical simulation tool takes into account the dependency and thus generates a more realistic estimation. The statistical simulation tool is applied to an ADC BIST technique to validate the effectiveness. The results demonstrated that the simple high speed flash ADC is sensitive to process variation, and the static BIST technique is suitable for testing static specifications but not dynamic specifications.
Subjects
統計模擬
內建自我測試電路
效能評估
Evaluation
Statistical Simulation
BIST
Type
thesis
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