Effect of Film Thickness on Magnetic Properties of FePt Thin Films Deposited on Amorphous SiO2 Substrate Directly
Resource
IEEE Transactions on Magnetics, 47(10), 3889-3892
Journal
IEEE Transactions on Magnetics
Journal Volume
47
Journal Issue
10
Pages
3889-3892
Date Issued
2011
Date
2011
Author(s)
Shen, C.L.
Kuo, P.C.
Lin, G.P.
Chen, S.C.
Huang, K.T.
Abstract
FePt thin films with different thicknesses (2.5-30 nm) were deposited alternately with Fe and Pt layers on amorphous SiO 2 substrate without any underlayer and then were postannealed at 700°C for 30 min. The dependences of microstructures, degree of ordering, and magnetic properties on FePt film thickness were investigated. The fct-FePt (001) texture films could be obtained by dc magnetron sputtering of (Fe/Pt) n multilayer on amorphous SiO 2 substrate after annealing at 700°C for 30 min. The increasing degree of L1 0 ordering was probably due to the thicker films providing more L1 0 -ordering nucleation sites. The island-like FePt grains formed on the SiO 2 substrates as the film was thinner than 7.5 nm. Both the values of out-of-plane squareness (S ⊥ ) and coercivity (Hc ⊥ ) were higher than those of in-plane ones for all film thicknesses. The values of S ⊥ are close to 1 and Hc ⊥ are in the range of 9.0-15 kOe for FePt thin films with a thickness of 5-15 nm after annealing at 700°C for 30 min.
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