XPS Depth Profiling of Organic Thin-Films using C60 Sputtering

Resource

Analytical Chemistry,80,501-0.

Journal

Analytical Chemistry

Journal Issue

80

Pages

501-0

Date Issued

2008-11

Date

2008-11

Author(s)

Chen, Ying-Yu

Yu, Bang-Ying

Hsu, Mao-Feng

Wang, Wei-Ben

Lin, Wei-Chun

Lin, Yu-Chin

Jou, Jwo-Huei

Shyue, Jing-Jong

URI

Type

journal article