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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Details
Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Journal
IEEE Journal of Display Technology
Journal Volume
10
Journal Issue
1
Pages
19-26
Date Issued
2014-01
Author(s)
E. H. Ma
W. E. Wei
H. Y. Li
J. C. M. Li
I. C. Cheng
Y. H. Yeh
I-CHUN CHENG
CHIEN-MO LI
DOI
10.1109/JDT.2013.2277590
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/388864
Type
journal article