Improve the VDT circuit and compatibility issue of controller IC
Date Issued
2005
Date
2005
Author(s)
Fang, Kuei-Hung
DOI
en-US
Abstract
The production of small memory cards (SD card and MMC card) has significantly increased in recent years, explaining the short supply of flash memory. Large electronics companies, such as Samsung, Toshiba, Micro, Hynix and Infinine produced large quantities of flash memory in 2004 successively. These companies also plan to introduce high-capacity Flash memory to fulfill market demand. Another significant component of small memory cards is the controller IC, which is also increasing the subject of research and development. Therefore, the compatibility among consumer peripheral products is another important subject.
This investigation attempts to improve the VDT (voltage detect test) circuit of controller IC and enhance its compatibility to support a wide variety of consumer products in accordance with consumer market demand. The current immature controller IC has two major limitations to be solved. One difficulty is that the VDT circuits do not work. The output-voltage remains the same even when the trimming fuse is destroyed. The other problem is the power-on problem for CANON DSC compatibility issue, caused by power-on-strap failure. The verified procedure, experiments and results are presented in this investigation. Finally, this investigation discovers the root cause of VDT poly fuse resistor and one address pin floating problems, and modifies the layout, net-list and masks to fix the bugs and enable mass production smoothly. The controller IC is fabricated using UMC 0.18um 1P4M GENERICII logic technology.
Subjects
控制器
相容性
Flash memory
Controller
VDT
compatibility
Type
thesis
File(s)![Thumbnail Image]()
Loading...
Name
ntu-94-P91943014-1.pdf
Size
23.31 KB
Format
Adobe PDF
Checksum
(MD5):5d4bb932bbb1f2a5c179c68b7c49bace