Influence of the thickness variation of the SiOx layer on the Si quantum dots based MOSLED

Journal

Proceedings of SPIE - The International Society for Optical Engineering

Journal Volume

7987

Date Issued

2011

Author(s)

Lai, B.-H.

Cheng, C.-H.

DOI

10.1117/12.889947

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500366

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-79953011381&doi=10.1117%2f12.889947&partnerID=40&md5=5ea2c5114b6ac7c95df5df773551b29d

Type

conference paper