Defect-Tolerant Hierarchical Sorting Networks for Wafer-Scale Integration
Resource
IEEE Journal of Solid-State Circuits, v.26 n.9, p.1212-1222
Journal
IEEE Journal of Solid-State Circuits
Journal Volume
v.26 n.9
Pages
1212-1222
Date Issued
1992-02
Date
1992-02
Author(s)
Kuo, Sy-Yen
Type
journal article