Preparation and properties of barium incorporated strontium bismuth tantalate ferroelectric thin films
Journal
Materials Research Society Symposium
Journal Volume
541
Pages
229-234
Date Issued
1999
Author(s)
Wen C.-Y.
Abstract
SrBi2Ta2O9 thin films doped with barium ions were studied, in which Ba/(Sr+Ba) = 0.3 and 0.5, meanwhile the content of (Sr+Ba) remains unity to keep the stoichiometry of SrBi2Ta2O9. Films were deposited using metalorganic decomposition method with spin-on coating. Crystallinity, surface morphology, and ferroelectric properties of prepared thin films were investigated. From X-ray diffraction (XRD) analysis, barium ions substituted strontium ions in the SrBi2Ta2O9 lattice. Shift of diffraction peaks was observed, indicating a slight distortion of the lattice while barium ions incorporated into. The observation of prepared films indicated that the grain size of films annealed at 750¢XC was about 0.7 approx. 0.8 £gm. Such barium incorporated SrBi2Ta2O9 thin films exhibited higher remanent polarization than the intrinsic SrBi2Ta2O9 thin films.
Type
journal article