A Heuristic Input Control Method for a Single-Product and High-Volume Wafer Fabrication to Minimize the Number of Photomask Changes
Resource
Journal of Manufacturing Systems 23 (1): 30-45
Journal
Journal of Manufacturing Systems
Journal Volume
23
Journal Issue
1
Pages
30-45
Date Issued
2005
Date
2005
Author(s)
Chern, C.C.
Huang, K. L.
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2.pdf
Size
5.88 MB
Format
Adobe PDF
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(MD5):2fddb9e7bb06f3cd77d0b82be8edb54d
