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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Scrubbing-Aware Secure Deletion for 3-D NAND Flash
Details
Scrubbing-Aware Secure Deletion for 3-D NAND Flash
Journal
Ieee Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal Volume
37
Journal Issue
11
Pages
2790-2801
Date Issued
2018
Author(s)
Wang, Wei-Chen
Ho, Chien-Chung
Chang, Yuan-Hao
Kuo, Tei-Wei
Lin, Ping-Hsien
TEI-WEI KUO
DOI
10.1109/TCAD.2018.2857260
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/489903
Type
journal article