Direct determination of flat-band voltage for metal/high 庥 oxide/semiconductor heterointerfaces by electric-field-induced second-harmonic generation

Journal

Applied Physics Letters

Journal Volume

98

Journal Issue

17

Date Issued

2011

Author(s)

Chang, C.-L.

Lee, W.C.

Chu, L.K.

Kwo, J.

Chang, Y.-M.

DOI

10.1063/1.3583463

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443366

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-79955686866&doi=10.1063%2f1.3583463&partnerID=40&md5=3f27ca62d423da22f42a96757b20fee8

Type

journal article