An Analysis of Partially Replicated Two-Level Main-Effect Plans
Date Issued
2011
Date
2011
Author(s)
Chen, Wen-Hsuan
Abstract
Partially replicated designs usually have better performance on screening experiments than unreplicated designs, due mainly to that they provide error variance estimates based on pure replicates. However, when additional repeated runs augmented to an orthogonal design, the resulting partially replicated design usually turns to be non-orthogonal. According to the extended minimum aberration (EMA) criterion proposed by Tsai and Liao (2010), we assess the robustness of non-orthogonal partially replicated two-level main-effect designs against non-negligible two-factor or higher order interactions. This study first investigates type I error rate control and power of EMA partially replicated two-level main-effect plans in significance test for active factors. Then, expected length and coverage probability for the confidence interval estimation for main effects, and determination for the number of repeated runs are also discussed.
Subjects
D-optimal designs
robustness
extended minimum aberration
non-orthogonal designs
Type
thesis
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