Threading Dislocation Induced Low Frequency Noise in Strained-Si nMOSFETs

Resource

IEEE Electron Device Letters 26 (9): 667-669

Journal

IEEE Electron Device Letters

Journal Volume

26

Journal Issue

9

Pages

667-669

Date Issued

2005

Date

2005

Author(s)

Hua, W.-C.

Lee, M.H.

Chen, P.S.

Tsai, M.-J.

Liu, C.W.

URI

Type

journal article

File(s)

Name

57.pdf

Size

277.25 KB

Format

Adobe PDF

Checksum

(MD5):97bf2e30c6a4b04ce34f310dbe6fbfcf