Topography and magnetoresistance in Nd0.6Sr0.4MnO films
Journal
Physica C: Superconductivity and its Applications
Journal Volume
364-365
Pages
668-673
Date Issued
2001
Author(s)
Abstract
The highly textured Nd0.6Sr0.4MnO3 thin films with different thickness t were obtained. The maximum magnetoresistance (MR) ratio, defined as [R(0) - R(1.5 T)]/R(0) at the insulating- to metallic-phase transition temperature, was found to increase with decreasing t, reaching a value of 75% for t = 500 Å. However, when t was further decreased down to 100 Å, the MR ratio was not significantly affected. In conjunction with our topographic results, we have attributed the saturation of MR ratio to the achieving of an optimized interface strain. © 2001 Elsevier Science B.V. All rights reserved.
Type
journal article