Identification of embedded charge defects in suspended silicon nanowires using a carbon-nanotube cantilever gate

Journal

Applied Physics Letters

Journal Volume

99

Journal Issue

5

Date Issued

2011

Author(s)

CHIEH-HSIUNG KUAN

Lan, Y.-W.

Nguyen, L.-N.

Lai, S.-J.

Lin, M.-C.

Kuan, C.-H.

Chen, C.-D.

CHIEH-HSIUNG KUAN

DOI

URI

Type

journal article