Performance enhancement of the nMOSFET low-noise amplifier by package strain
Journal
IEEE Transactions on Electron Devices
Journal Volume
54
Journal Issue
1
Pages
160-162
Date Issued
2007
Author(s)
Hua, W.-C.
Chang, H.-L.
Wang, T.
Lin, C.-Y.
Lin, C.-P.
Lu, S.S.
Meng, C.C.
Liu, C.W.
SDGs
Type
journal article
