Analysis of the dark current in the bulk of InAs diode detectors
Journal
Journal of Applied Physics
Journal Volume
80
Journal Issue
9
Pages
5454-5458
Date Issued
1996
Author(s)
CHIEH-HSIUNG KUAN
Kuan, C.H.
Lin, R.-M.
Tang, S.-F.
Sun, T.-P.
CHIEH-HSIUNG KUAN
Type
journal article