X-ray diffraction studies of the recrystallization of C60-based polymers
Journal
Fullerene Science and Technology
Journal Volume
7
Journal Issue
4
Pages
573-585
Date Issued
1999
Author(s)
Huang, Y.-S.
Cheng, Y.-N.
Li, J.-D.
Lu, W.-L.
Wang, H.-C.
Chao, C.-H.
Chang, S.-L.
Chiang, L.Y.
Abstract
A time-dependent x-ray scattering study is presented of the kinetics of the C60-based star polymer containing 6 urethane-connected polyether and the star model polymers containing 4, 3, and 2 urethane-connected polyether arms. By varying the temperature from 40°C to -40°C, the order-disorder phase transition (recrystallization) of the polymers has been observed. Two crystalline domains with the periodicities of 4.5 ± 0.6 angstrom and 3.7 ± 0.4 angstrom were detected. The domain sizes ranging from 70 angstrom to 250 angstrom, the transition temperatures from -15°C to 25°C and the maximum percentage of recrystallization from 13% to 34% increase as the number of polyether arms increases. The x-ray scattering peaks of the order phase grow up as I1 + I2 (1 - e-t/t(0)), where I1 and I2 are the initial intensity and the proportional intensity modulus, respectively. The relaxation time t0 of the order phase is varying as a power law with respect to the reduced temperature TR(=(T - Tc)/Tc): t0 = (35±10)·|TR|-1.42±0.07 seconds for the C60-based star polymer containing 6 urethane-connected polyether; t0 = (315±64)·|TR|-1.68±0.08 seconds for the star model polymer containing 4 urethane-connected polyether arms.
Publisher
Marcel Dekker Inc, New York
Type
journal article