ITRIM: I/O-Aware TRIM for Improving User Experience on Mobile Devices
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal Volume
40
Journal Issue
9
Pages
1782-1795
Date Issued
2021
Author(s)
Abstract
TRIM is a recommended command to deliver data invalidation information of the file system to flash storage. It is issued on both system level and device level. Since it can reduce the number of data copies during device-level garbage collection (DGC), TRIM has been widely used to improve the endurance and performance of mobile devices. Contrary to the common belief, this work identifies that the default TRIM scheme has both merit and drawback to the performance of mobile devices, especially in flash-friendly file system (F2FS), which is a commonly used file system in mobile devices. On one hand, TRIM can reduce garbage collection migration to prolong the flash lifetime as well as improving I/O throughput; On the other hand, TRIM may induce I/O contentions. This article proposes a new TRIM scheme, iTRIM, to distribute the timing overheads to system idle time. To further reduce I/O contention and improve I/O performance, the design of iTRIM considers the TRIM size, and the logical addresses' pattern of victim invalidated data. Experimental results show that iTRIM can minimize I/O contentions while retaining the benefits of the default TRIM scheme for endurance and performance. ? 1982-2012 IEEE.
Subjects
Discard
F2FS
mobile device
TRIM
user experience
File organization
User experience
File systems
Flash storage
Garbage collection
Idle time
Number of datum
System levels
Digital storage
Type
journal article