Multilevel full-chip routing with testability and yield enhancement

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal Volume

26

Journal Issue

9

Pages

1625-1636

Date Issued

2007

Author(s)

Li, K.S.-M.

Chang, Y.-W.

Lee, C.-L.

Su, C.

Chen, J.E.

DOI

10.1109/TCAD.2007.895587

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-34548268617&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/332273

Type

journal article