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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks
Details
The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks
Resource
Microwave Symposium Digest, 2004 IEEE MTT-S International
Journal
IEEE MTT-S International Microwave Symposium
Journal Volume
3
Pages
1801-1804
Date Issued
2004-06
Date
2004-06
Author(s)
Lu, Hsin-Chia
Chu, Tah-Hsiung
DOI
10.1109/MWSYM.2004.1338952
DOI
0149-645X
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-4544349732&partnerID=MN8TOARS
http://ntur.lib.ntu.edu.tw//handle/246246/200704191002733
http://ntur.lib.ntu.edu.tw/bitstream/246246/200704191002733/1/01338952.pdf
SDGs
[SDGs]SDG7
Type
conference paper
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Name
01338952.pdf
Size
310.81 KB
Format
Adobe PDF
Checksum
(MD5):b2719dbcdefaa12f102a526fbce8f551
