High-Stability Quantum Dot-Converted 3-in-1 Full-Color Mini-Light-Emitting Diodes Passivated with Low-Temperature Atomic Layer Deposition
Journal
IEEE Transactions on Electron Devices
Journal Volume
68
Journal Issue
2
Pages
597-601
Date Issued
2021
Author(s)
Abstract
In this study, we demonstrate a 3-in-1 mini-light emitting diodes (LEDs) with {160} \times {65}\,\,\mu \text{m}^{{2}} mini-LED subpixel chip size. Blue mini-LEDs are combining with red and green quantum dots (QDs) by using ink-jet printing technique to achieve a full-color and high-quality mini-LEDs array in the form of a monolithic chip. Subsequently, low-Temperature passivated by atomic layer deposition (ALD) at 50 °C is used to effectively avoid the photo-oxidation and maintain the color purity, 99.5% National Television Standards Committee (NTSC) and 89.6% of Rec. 2020 color gamut of red as well as green QDs (GQDs) during 300 h reliability test under 50 °C/50% relative humidity (RH) condition. The environment stability L50 of both samples is 6761 and 5889 h for red and green QDs. Finally, we advocate the potential of the demonstrated highly stable full-color QD mini-LEDs to be applied in the display technology. This research also meets the requirement for a simple QD deposition method which is expected to achieve a breakthrough. ? 1963-2012 IEEE.
Subjects
Full-color
light-emitting diodes (LEDs)
low-Temperature atomic layer deposition (ALD)
quantum dots (QDs)
reliability
Color
Ink jet printing
Nanocrystals
Organic light emitting diodes (OLED)
Semiconductor quantum dots
Television standards
Temperature
Color gamuts
Deposition methods
Display technologies
Environment stabilities
Highly stables
Low temperatures
Monolithic chip
Reliability test
Atomic layer deposition
Type
journal article