Reliability-driven power/ground routing for analog ICs

Journal

ACM Transactions on Design Automation of Electronic Systems

Journal Volume

17

Journal Issue

1

Date Issued

2012

Author(s)

Lin, J.-W.

Ho, T.-Y.

DOI

10.1145/2071356.2071362

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/497937

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84863250786&doi=10.1145%2f2071356.2071362&partnerID=40&md5=d4a3d8ed8bc45e4c11013668c4da99c0

Type

journal article