Life Assessment of Electronic Components based on Acceleration Life Test and in Consideration of both Failure Rate and Reaction Rate
Date Issued
2010
Date
2010
Author(s)
Chan, Peng-An
Abstract
Nowadays, due to the growing industrial competition and technological developments, accelerated tests and compressed-stress tests are essential to evaluate lives and reliabilities of electronic products. By using these tests, researchers can obtain data to evaluate through certain physical models the lifetimes and reliabilities of products and components when they are used in normal condition. Taking the compressed-stress test of electronic components for instance, a frequently used physical model is called the acceleration model. It adopts the concept of “reaction rate” originated from chemistry studies. To simplify the computational process, it is common to assume the reaction rate is a constant although the assumption may not be reasonable enough. To remedy it, a non-constant chemical reaction rate is proposed in the present study. The rate is considered a function of the non-steady-state failure rate used in reliability engineering and it thus becomes a function of time. Based on this concept, formulas are derived for us to evaluate a component’s lifetime when it is used in normal condition. The proposed method is then applied to the accelerated test result of a certain type of electronic connector in order to evaluate its lifetime when it is used in a normal condition. The result indicates the proposed method does reduce the uncertainty of evaluation and enhance reliability of the output.
Subjects
compressed-stress test
acceleration model
reaction rate
failure rate
non-steady-state failure
Type
thesis
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