Imaging the near-field intensity gradients with a tapping-mode near-field scanning optical microscope

Resource

Proceedings of the 46th Annual Meeting of American Vacuum Society 1999, Seattle, U.S.A.(1999)

Journal

Proceedings of the 46th Annual Meeting of American Vacuum Society 1999, Seattle

Pages

-

Date Issued

1999

Date

1999

Author(s)

Ho, F. H.

Tsai, D. P.

Yang, C. W.

URI

Type

conference paper