On-chip Zernike thin film phase plate for in-focus transmission microscopy imaging of soft materials
Date Issued
2014
Date
2014
Author(s)
Kuo, Pai-Chia
Abstract
Transmission electron microscopy (TEM) is a powerful tool in imaging nanostructures, yet its capability is limited with respect to the imaging of soft materials, because of the intrinsic low contrast problem. TEM phase plates have been in development for decades, yet a reliable phase plate technique has not been available because the performance of TEM phase plates deteriorates too quickly. Such an obstacle prohibits in-focus TEM phase imaging to be routinely achievable, thus limits the technique being used in practical applications. Here we present an on-chip thin film Zernike phase plate which can effectively release charging, and allow reliable in-focus TEM images of soft materials with enhanced contrast to be routinely obtained. With this stable system, we were able to characterize many polymer solar cell specimens, and consequently identified and verified the existence of an unexpected nanoparticle-phase. Furthermore, we were also able to observe the fine structures of an E. coli specimen, without staining, using this on-chip thin film phase plate. Our system, which can be installed on a commercial TEM, opens up exciting possibilities for TEM to characterize soft materials.
Subjects
穿透式電子顯微鏡
相位板
軟物質
Type
thesis
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