SiL Core Edge Fine Structure in an Oxidation Series of Silicon Compounds:a Comparison of Micro Electron Energy Loss Spectra with Theory

Resource

Journal of Applied Physics, v.58, p.3463-3469

Journal

Journal of Applied Physics

Journal Volume

v.58

Pages

3463-3469

Date Issued

1985

Date

1985

Author(s)

Lin, Sheng-Hsien

URI

Type

journal article