A leakage-current-recycling phase-locked loop in 65nm CMOS technology

Journal

IEEE Journal of Solid-State Circuits

Journal Volume

47

Journal Issue

11

Pages

2693-2700

Date Issued

2012-11

Author(s)

I-Ting Lee

Yun-Ta Tsai

DOI

10.1109/jssc.2012.2209810

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/374059

SDGs

[SDGs]SDG7

Type

journal article