Raman scattering as a characterization tool for epitaxial GaN thin films grown on sapphire by turbo disk metalorganic chemical vapor deposition
Resource
Appl. Optics,36,2917-2922.
Journal
Appl. Optics
Journal Issue
36
Pages
2917-2922
Date Issued
1997-01
Date
1997-01
Author(s)
Feng, Z.C.
Schurman, M.
Stall, R.A.
Pavloski &, M.
Whitley, A.
Type
journal article