Test Pattern Modification for Average IR-Drop Reduction

Journal

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal Volume

24

Journal Issue

1

Pages

38-49

Date Issued

2016

Author(s)

Ding, W.-S.

Hsieh, H.-Y.

Han, C.-Y.

Li, J.C.-M.

Wen, X.

DOI

10.1109/TVLSI.2015.2391291

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505983

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84927779731&doi=10.1109%2fTVLSI.2015.2391291&partnerID=40&md5=f6f8a5bc5445e5508772b4ee6a6adea5

Type

journal article