Transmission electron microscopy characterization of HfO 2/GaAs(001) heterostructures grown by molecular beam epitaxy

Journal

Applied Physics A: Materials Science and Processing

Journal Volume

91

Journal Issue

4

Pages

585-589

Date Issued

2008

Author(s)

Liou, S.C.

Chu, M.-W.

Chen, C.H.

Lee, Y.J.

Chang, P.

Lee, W.C.

Kwo J.

DOI

10.1007/s00339-008-4493-3

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443424

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-43449110706&doi=10.1007%2fs00339-008-4493-3&partnerID=40&md5=ede99719bb727b811221b931bc5d6aaf

Type

journal article