Modeling and optimization of edge dislocation stressors
Journal
IEEE Electron Device Letters
Journal Volume
34
Journal Issue
8
Pages
948-950
Date Issued
2013
Author(s)
Tsai, M.-H.
Jan, S.-R.
Yeh, C.-Y.
Liu, C.W.
Goldstein, R.V.
Gorodtsov, V.A.
Shushpannikov, P.S.
Type
journal article