Boundary Scan for 5GHz RF Pins Using LC Isolation Networks

Resource

VLSI Test Symposium, 2004. Proceedings. 22nd IEEE

Journal

IEEE VLSI Test Symp.

Pages

347-350

Date Issued

2004-04

Author(s)

Tian-Wei Huang

Pei-Si Wu

Ren-Chieh Liu

Jeng-Han Tsai

Huei Wang

DOI

URI

Type

conference paper

File(s)

Name

01299263.pdf

Size

1.4 MB

Format

Adobe PDF

Checksum

(MD5):31f02ac151ee412e6f17581f0c6a7171