Automatic test pattern generation

Journal

Electronic Design Automation for IC System Design, Verification, and Testing

Pages

559-604

Date Issued

2017

Author(s)

Cheng, K.-T.T.

Wang, L.-C.

Li, H.

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505993

https://doi.org/10.1201/b19569

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85052782837&doi=10.1201%2fb19569&partnerID=40&md5=5b72b15daa582a04d54c5cd14bd11600

Type

book part