Atomic layer deposition of aliphatic polyamides films
Date Issued
2014
Date
2014
Author(s)
Chen, Guan-Lun
Abstract
We studied the atomic layer deposition (ALD) processes of two polyamide films and their applications in flexible gas-permeation barriers. The two polyamides were: (1) poly-N-(2-aminoethyl)-3-oxopropanamide (PA32), deposited from malonyl chloride and ethylene diamide, and (2) poly-(E)-N-(2-aminoethyl)-4-oxobut-2-enamide (PA42),
deposited from fumaryl chloride and ethylene diamide. The polyamide films showed ALD process temperature of 75~125
Subjects
原子層沈積技術
聚醯胺
Type
thesis
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ntu-103-R01527028-1.pdf
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