Effects of emitter scaling and device biasing on millimeter-wave VCO performance in 200 GHz SiGe HBT technology

Journal

Asia-Pacific Microwave Conference Proceedings, APMC

Journal Volume

2

Date Issued

2005

Author(s)

YI-JAN EMERY CHEN

Kuo, W.-M.L.

Chen, Y.-J.E.

Cressler, J.D.

Freeman, G.

Chen, Y.-J.E.

DOI

10.1109/APMC.2005.1606401

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-33847217284&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/314309

Type

conference paper