68.2: Using rigorous electromagnetic analysis in modeling OLEDs with gratings

Journal

SID International Symposium

Journal Volume

42 1

Pages

1006-1009

Date Issued

2011

Author(s)

Yeh, W.-L.

Chiou, Y.-P.

Lin, C.-L.

Chen, C.-W.

Lee, C.-C.

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-84863200341&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/364859

Type

conference paper