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  4. Enhanced light harvesting of nitride-based nanopillars covered with ZnO using indium-tin oxide nanowhiskers
 
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Enhanced light harvesting of nitride-based nanopillars covered with ZnO using indium-tin oxide nanowhiskers

Journal
Japanese Journal of Applied Physics
Journal Volume
53
Journal Issue
4 SPEC. ISSUE
Date Issued
2014
Author(s)
Hsu L.-H
CHIEN-CHUNG LIN  
Lee H.-Y
Huang J.-K
Han H.-V
Tsai Y.-L
Yu P
Kuo H.-C
Lee C.-T.
DOI
10.7567/JJAP.53.04ER10
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84903268461&doi=10.7567%2fJJAP.53.04ER10&partnerID=40&md5=f7ce65207693f6df07839dbc682412da
https://scholars.lib.ntu.edu.tw/handle/123456789/632175
Abstract
Nitride-based nanopillars were successfully fabricated by nanoimprint lithography. A nanowhisker of indium-tin oxide (ITO) deposited by on oblique evaporation method was investigated in nitride-based nanopillars and thin ZnO layers grown by atomic layer deposition (ALD). From the results of field-emission scanning electron microscopy (SEM) measurement, it was found that ITO whiskers grew on nitride-based nanopillars covered with ZnO. Moreover, from the results of UV-visible spectrophotometry and bidirectional reflectance distribution function (BRDF) measurements, it was found that this hybrid structure of ITO nanowhiskers above a ZnO medium enhanced the broadband and angle-independent antireflection in the range between 380 and 600nm. We used the hybrid design of the ITO/ZnO structure to achieve the lowest reflectance value between 3.8 and 10.9% in a quantum well absorption range. © 2014 The Japan Society of Applied Physics.
Other Subjects
Atomic layer deposition; Distribution functions; Indium; Nanoimprint lithography; Nanowhiskers; Reflection; Tin; Zinc oxide; Angle-independent; Bidirectional reflectance distribution functions; Field emission scanning electron microscopy; Hybrid structure; Indium tin oxide; Oblique evaporation; Reflectance values; UV-visible spectrophotometry; Nitrides
Type
conference paper

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