An EOS-Free PNP-enhanced cascoded NMOSFET structure for high voltage application

Journal

IEEE International Reliability Physics Symposium

Date Issued

2011

Author(s)

Wang, S.-Y.

Chang, Y.-W.

Chen, Y.-Y.

He, C.-W.

Wu, G.-W.

Lu, T.-C.

Chen, K.-C.

Lu, C.-Y.

DOI

10.1109/IRPS.2011.5784506

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-79959286664&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/365156

SDGs

[SDGs]SDG7

Type

conference paper