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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Automatic functional test program generation for microprocessors
Details
Automatic functional test program generation for microprocessors
Resource
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Journal
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Pages
-
Date Issued
1988-06
Date
1988-06
Author(s)
Lin, C.-S.
Ho, H.-F.
DOI
10.1109/DAC.1988.14825
DOI
N/A
URI
http://ntur.lib.ntu.edu.tw//handle/246246/2007041910032129
Type
journal article
File(s)
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Name
00014825.pdf
Size
37.35 KB
Format
Adobe PDF
Checksum
(MD5):607240ad2e36f624106ae61c4e7409e4
