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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Scanning near-field microwave microscope using a rectangular waveguide probe
Details
Scanning near-field microwave microscope using a rectangular waveguide probe
Journal
2011 IEEE AP-S and USNC/URSI International Symposium
Date Issued
2011-07
Author(s)
S. N. Hsieh
T. H. Chu
M. T. Chen
TAH HSIUNG CHU
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/366352
Type
conference paper