The correlation of surface defects and reverse breakdown of 4H-SiC Schottky barrier diodes

Journal

Journal of Electronic Materials

Journal Volume

36

Journal Issue

4

Pages

272-276

Date Issued

2007

Author(s)

Capano, Michael A.

DOI

10.1007/s11664-006-0075-3

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-34249330681&doi=10.1007%2fs11664-006-0075-3&partnerID=40&md5=ef902db42170e3fd8a1088aae65100b2

SDGs

[SDGs]SDG14

Type

journal article