Surface Plasmon Leakage in Its Coupling with an InGaN/GaN Quantum Well through an Ohmic Contact

Resource

Applied Physics Letters, 91(6), 063121.

Journal

Applied Physics Letters

Journal Volume

91

Journal Issue

6

Pages

-

Date Issued

2007-08

Date

2007-08

Author(s)

Yeh, Dong-Ming

Huang, Chi-Feng

Lu, Yen-Cheng

Chen, Cheng-Yen

Tang, Tsung-Yi

Huang, Jeng-Jie

Shen, Kun-Ching

Yang, C. C.

URI

Type

journal article

File(s)

Name

903.pdf

Size

23.19 KB

Format

Adobe PDF

Checksum

(MD5):1226641d654a06b304e38ccb06cc3930