AlN films on GaN: Sources of error in the photoemission measurement of electron affinity

Journal

Journal of Applied Physics

Journal Volume

89

Journal Issue

3

Date Issued

2001

Author(s)

Bermudez, V.M.

Wu, C.-I.

Kahn, A.

DOI

10.1063/1.1333716

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-18044401316&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/293784

Type

journal article