Diagnosis of Multiple Scan Chain Timing Fault

Resource

IEEE Trans. Computer-aided Design of IC and Syst.,Vol. 27, No.6, pp.1104-1116.

Journal

IEEE Trans. Computer-aided Design of IC and Syst

Journal Volume

Vol. 27

Journal Issue

No.6

Pages

1104-1116

Date Issued

2008

Date

2008

Author(s)

Chuang, W.S.

Li, James C.-M.

URI

Type

journal article