Diagnosis of Logic-chain Bridging Faults
Journal
IEEE Int’l Workshop on RTL and High Level Testing
Date Issued
2008-01
Author(s)
Abstract
We propose five logic-to-chain bridging fault models, which involve one net in the combinational logic and the other net in the scan chain. Test results of logic-to-chain bridging faults, unlike any existing fault, depend on the previous scan inputs as well as primary inputs. An accurate diagnosis technique is presented to locate logic-to-chain bridging faults. In addition, a bridging pair extraction algorithm is proposed to quickly extract bridging net pairs from the layout. Experimental results on ISCAS benchmark circuits show that, on the average, logic-to-chain bridging faults can be diagnosed within an accuracy of three bridging pairs. The technique is still applicable when only ten failing patterns are recorded on the tester.
Type
conference paper