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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Versatile W-band on-wafer MMIC test set
Details
Versatile W-band on-wafer MMIC test set
Journal
47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996
Pages
95-101
Date Issued
1996
Author(s)
Lin, E.W.
Huang, T.W.
Lo, D.C.W.
Wang, H.
Yang, D.C.
Dow, G.S.
HUEI WANG
TIAN-WEI HUANG
DOI
10.1109/ARFTG.1996.327169
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/497420
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85060904698&doi=10.1109%2fARFTG.1996.327169&partnerID=40&md5=7df69945afdfbf99c00fc03992736543
Type
conference paper
