Versatile W-band on-wafer MMIC test set
Journal
47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996
Pages
95-101
Date Issued
1996
Author(s)
Abstract
This paper describes the successful characterization of various W-band MMICs uniquely different in function using an automated on-wafer test set. Several thousand MMICs, including low-noise amplifiers, mixers, VCOs, and detectors, have been tested for gain, noise figure, tuning range, and responsivity, respectively. The ability of the test set to easily accommodate the individual test requirements of the different MMICs is important in establishing a high throughput system and demonstrates both its versatility and flexibility.
SDGs
Type
conference paper