A Static Timing Analyzer for Flexible TFT Circuits
Date Issued
2009
Date
2009
Author(s)
Hsu, Chao-Hsuan
Abstract
Thin-film transistors (TFTs) technology is widely used in large area, flexible and printed electronics. Due to the compressive or tensile strain, change in mobility is a serious concern for flexible TFT circuits. A static timing analyzer for flexible electronics (STAF) is proposed for flexible TFT circuits under strain. The simulation results of ISCAS’89 benchmark circuits show that the maximum increase in longest path delay is 32% and maximum reduction in shortest path delay is 9%. Four types of maps can be plotted and the “hot spot”, which is the most sensitive to bending, can be identified. So far as we know, STAF is the first design for flexibility EDA tool for flexible TFT electronics.
Subjects
flexible electronics
static timing analysis
bending
longest path delay
shortest path delay
Type
thesis
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ntu-98-R96943079-1.pdf
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