Layout-Dependent Effects-Aware Analytical Analog Placement
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal Volume
35
Journal Issue
8
Pages
1243-1254
Date Issued
2016
Author(s)
Abstract
Layout-dependent effects (LDEs) have become a critical issue in modern analog and mixed-signal circuit designs. The three major sources of LDEs, well proximity, length of oxide diffusion, and oxide-to-oxide spacing, significantly affect the threshold voltage and mobility of devices in advanced technology nodes. In this paper, we propose the first work to consider the three major sources of LDEs during analog placement. We first transform the three LDE models into nonlinear analytical placement models. Then an LDE-aware analytical analog placement algorithm is presented to mitigate the influence of the LDEs while improving circuit performance. Experimental results show that our placement algorithm can effectively and efficiently reduce the LDE-induced variations and improve circuit performance.
SDGs
Type
journal article