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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Compact Modeling of Sub-90nm CMOS VLSI Devices Considering Fringing Electric Field Effects
Details
Compact Modeling of Sub-90nm CMOS VLSI Devices Considering Fringing Electric Field Effects
Journal
NSC Seminar
Date Issued
2008-11
Author(s)
JAMES-B KUO
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/342568
Type
conference paper